55 search results - page 8 / 11 » Tolerating Radiation-Induced Transient Faults in Modern Proc... |
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
DSN
2002
IEEE
14 years 13 days ago
2002
IEEE
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
CCGRID
2003
IEEE
14 years 23 days ago
2003
IEEE
Due to the ever-widening performance gap between processors and disks, I/O operations tend to become the major performance bottleneck of data-intensive applications on modern clus...
ISCA
2002
IEEE
14 years 12 days ago
2002
IEEE
We develop an availability solution, called SafetyNet, that uses a unified, lightweight checkpoint/recovery mechanism to support multiple long-latency fault detection schemes. At...
CCGRID
2006
IEEE
14 years 1 months ago
2006
IEEE
With the increasing number of processors in modern HPC(High Performance Computing) systems, there are two emergent problems to solve. One is scalability, the other is fault tolera...