75 search results - page 8 / 15 » Tolerating hardware device failures in software |
ICCAD
2010
IEEE
13 years 7 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
HPCA
2009
IEEE
14 years 10 months ago
2009
IEEE
The Architectural Vulnerability Factor (AVF) of a hardware structure is the probability that a fault in the structure will affect the output of a program. AVF captures both microa...
MOMPES
2008
IEEE
14 years 4 months ago
2008
IEEE
During its lifetime, embedded systems go through multiple changes to their runtime architecture. That is, threads, processes, and processor are added or removed to/from the softwa...
CODES
2009
IEEE
14 years 4 months ago
2009
IEEE
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...
EMSOFT
2009
Springer
14 years 4 months ago
2009
Springer
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...