1040 search results - page 20 / 208 » Tools for modeling and solving search problems |
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
FLAIRS
2007
13 years 10 months ago
2007
We deal with the search process of the GraphPlan algorithm in this paper. We concentrate on a problem of finding supports for a sub-goal which arises during the search. We model t...
AIM
2004
13 years 7 months ago
2004
Satellite domains are becoming a fashionable area of research within the AI community due to the complexity of the problems that these domains need to solve. With the current US a...
IPPS
1998
IEEE
13 years 12 months ago
1998
IEEE
Abstract. Nowadays genetic algorithms stand as a trend to solve NPcomplete and NP-hard problems. In this paper, we present a new hybrid metaheuristic which uses Parallel Genetic Al...
WOA
2000
13 years 9 months ago
2000
Big changes are taking place in the area of information supply and demand on Internet. The first big change, which took place quite a while ago, is related to the type of informat...