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VLSID
2008
IEEE
153views VLSI» more  VLSID 2008»
14 years 10 months ago
Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
Yuanlin Lu, Vishwani D. Agrawal
ICDAR
2009
IEEE
13 years 7 months ago
Pre-Processing of Degraded Printed Documents by Non-local Means and Total Variation
We compare in this study two image restoration approaches for the pre-processing of printed documents: namely the Non-local Means filter and a total variation minimization approac...
Laurence Likforman-Sulem, Jérôme Darb...
ICIP
2009
IEEE
13 years 7 months ago
Total variation projection with first order schemes
This article proposes a new algorithm to compute the projection on the set of images whose total variation is bounded by a constant. The projection is computed through a dual form...
Mohamed-Jalal Fadili, Gabriel Peyré
ICCV
2009
IEEE
15 years 2 months ago
Convex Optimization for Multi-Class Image Labeling with a Novel Family of Total Variation Based Regularizers
We introduce a linearly weighted variant of the total variation for vector fields in order to formulate regularizers for multi-class labeling problems with non-trivial interclass...
J. Lellmann, F. Becker, C. Schn¨orr
SCALESPACE
2009
Springer
14 years 4 months ago
Convex Multi-class Image Labeling by Simplex-Constrained Total Variation
Multi-class labeling is one of the core problems in image analysis. We show how this combinatorial problem can be approximately solved using tools from convex optimization. We sugg...
Jan Lellmann, Jörg H. Kappes, Jing Yuan, Flor...