Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Abstract. Many automatic testing, analysis, and verification techniques for programs can effectively be reduced to a constraint-generation phase followed by a constraint-solving ...
Vijay Ganesh, Adam Kiezun, Shay Artzi, Philip J. G...
As Web services proliferate, size and magnitude of UDDI Business Registries (UBRs) are likely to increase. The ability to discover Web services of interest then across multiple UB...
As computer systems continue to become more powerful and comdo programs. High-level abstractions introduced to deal with complexity in large programs, while simplifying human reas...
Kevin J. Hoffman, Patrick Eugster, Suresh Jagannat...
Abstract— The scale, reliability, and cost requirements of enterprise data centers require automation of center management. Examples include provisioning, scheduling, capacity pl...
Sandip Agarwala, Yuan Chen, Dejan S. Milojicic, Ka...