184 search results - page 24 / 37 » Towards Statistical Control of an Industrial Test Process |
SIGMOD
2007
ACM
14 years 7 months ago
2007
ACM
XML database functionality has been emerging in "XML-only" databases as well as in the major relational database products. Yet, there is no industry standard XML databas...
ELPUB
1999
ACM
13 years 12 months ago
1999
ACM
and abstract entry. But since the burgeoning of the scholarly literature since World War II, these processes had become well-known and expertly done by most organizations in the pu...
ICASSP
2011
IEEE
12 years 11 months ago
2011
IEEE
Nonparametric methods are widely applicable to statistical learning problems, since they rely on a few modeling assumptions. In this context, the fresh look advocated here permeat...
EUSFLAT
2003
13 years 9 months ago
2003
Industrial processes can be often modelled using Petri nets. If all the process variables (or events) are assumed to be twovalued signals, then it is possible to obtain a hardware...
ICSE
2010
IEEE-ACM
14 years 10 days ago
2010
IEEE-ACM
Change impact analysis aims at identifying software artifacts being affected by a change. In the past, this problem has been addressed by approaches relying on static, dynamic, a...