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» Towards Statistical Control of an Industrial Test Process
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VLSID
2007
IEEE
131views VLSI» more  VLSID 2007»
14 years 8 months ago
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
BMCBI
2006
169views more  BMCBI 2006»
13 years 7 months ago
Comparative analysis of haplotype association mapping algorithms
Background: Finding the genetic causes of quantitative traits is a complex and difficult task. Classical methods for mapping quantitative trail loci (QTL) in miceuse an F2 cross b...
Phillip McClurg, Mathew T. Pletcher, Tim Wiltshire...
BMCBI
2006
154views more  BMCBI 2006»
13 years 7 months ago
An improved procedure for gene selection from microarray experiments using false discovery rate criterion
Background: A large number of genes usually show differential expressions in a microarray experiment with two types of tissues, and the p-values of a proper statistical test are o...
James J. Yang, Mark C. K. Yang
DATAMINE
2002
139views more  DATAMINE 2002»
13 years 7 months ago
Using Site Semantics to Analyze, Visualize, and Support Navigation
To satisfy potential customers of a Web site and to lead them to the goods offered by the site, one should support them in the course of navigation they have embarked on. This pape...
Bettina Berendt
GECCO
2005
Springer
14 years 1 months ago
Using gene deletion and gene duplication in evolution strategies
Self-adaptation of the mutation strengths is a powerful mechanism in evolution strategies (ES), but it can fail. As a consequence premature convergence or ending up in a local opt...
Karlheinz Schmitt