184 search results - page 3 / 37 » Towards Statistical Control of an Industrial Test Process |
ECCV
2006
Springer
14 years 9 months ago
2006
Springer
Image restoration is a keen problem of low level vision. In this paper, we propose a novel - assumption-free on the noise model - technique based on random walks for image enhancem...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 2 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
IJCNN
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Each time more grows the necessity of guaranteeing itself security and trustworthiness of the equipment during the execution of the industrials processes. Then, it is v...
MM
2010
ACM
13 years 7 months ago
2010
ACM
We show several aspects of a complex mixed reality system that we have built and deployed in a real-world factory setting. In our system, virtual worlds, augmented realities, and ...
ITC
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...