26 search results - page 3 / 6 » Tracking Uncertainty with Probabilistic Logic Circuit Testin... |
CIKM
2005
Springer
14 years 1 months ago
2005
Springer
Schema matching is the problem of finding correspondences (mapping rules, e.g. logical formulae) between heterogeneous schemas e.g. in the data exchange domain, or for distribute...
TACAS
2004
Springer
14 years 25 days ago
2004
Springer
Numerical analysis based on uniformisation and statistical techniques based on sampling and simulation are two distinct approaches for transient analysis of stochastic systems. We ...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
VTS
2002
IEEE
14 years 11 days ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...