282 search results - page 17 / 57 » Transient Fault Detectors |
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
ICDCS
1998
IEEE
13 years 11 months ago
1998
IEEE
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
DSN
2005
IEEE
14 years 1 months ago
2005
IEEE
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...