282 search results - page 35 / 57 » Transient Fault Detectors |
IOLTS
2003
IEEE
14 years 25 days ago
2003
IEEE
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
ICECCS
2002
IEEE
14 years 15 days ago
2002
IEEE
This paper describes the application of the Test Automation Framework on the Mars Polar Lander (MPL) software. The premature shutdown of the descent engine on the MPL spacecraft i...
FPL
2006
Springer
13 years 11 months ago
2006
Springer
Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...
CAL
2006
13 years 7 months ago
2006
This paper makes a case for using multi-core processors to simultaneously achieve transient-fault tolerance and performance enhancement. Our approach is extended from a recent late...
IOLTS
2009
IEEE
14 years 2 months ago
2009
IEEE
The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibil...