282 search results - page 45 / 57 » Transient Fault Detectors |
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [1,2,3], focusing on transient-fault-tolerance techn...
ISPA
2004
Springer
14 years 26 days ago
2004
Springer
Abstract. Current solutions for fault-tolerance in HPC systems focus on dealing with the result of a failure. However, most are unable to handle runtime system configuration change...
IOLTS
2002
IEEE
14 years 13 days ago
2002
IEEE
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
ISCA
2002
IEEE
14 years 13 days ago
2002
IEEE
Exponential growth in the number of on-chip transistors, coupled with reductions in voltage levels, makes each generation of microprocessors increasingly vulnerable to transient f...