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ITC
1996
IEEE
123views Hardware» more  ITC 1996»
15 years 10 months ago
IDDQ Test: Sensitivity Analysis of Scaling
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...
Thomas W. Williams, Robert H. Dennard, Rohit Kapur...
ETFA
2008
IEEE
15 years 7 months ago
Production order life cycle in agent-based distributed manufacturing
Modern trends in manufacturing demand more flexible and adaptive handling of production order execution. Due to its distributed nature, agent-based systems become a suitable solut...
Aleksey Bratukhin
CSREAESA
2006
15 years 7 months ago
Chip OS: new architecture for next generation embedded system
Nowadays embedded system, hardware/software technology has progressed prosperously. In many field of industrial manufacture and people life, embedded system is indispensable. Rece...
Tianzhou Chen, Yi Lian, Wei Hu
INTEGRATION
2008
94views more  INTEGRATION 2008»
15 years 6 months ago
Variability in nanometer CMOS: Impact, analysis, and minimization
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
Dennis Sylvester, Kanak Agarwal, Saumil Shah
JCDL
2005
ACM
98views Education» more  JCDL 2005»
15 years 11 months ago
Exploring user perceptions of digital image similarity
The MIDAS project is developing infrastructure and policies for optimal display of digital information on devices with diverse characteristics. In this paper we present the prelim...
Unmil Karadkar, Richard Furuta, Jeevan Joseph John...