IDDQ Test: Sensitivity Analysis of Scaling

While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. Without major changes in the CMOS technology, it has been shown that the scaling of devices has signicant impact on the eectiveness of Iddq testing. The sensitivity of Iddq testing to individual device parameters is studied. It will be explained how Iddq testing becomes increasingly ineective in the scaled product with respect to most parameters and can be improved with others.

• Type: Conference
• Year: 1996
• Where: ITC
• Authors: Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly
• Keywords: Hardware, IDDQ Testing, Individual Device Parameters, ITC 1996, Major Changes