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ESWS
2005
Springer
15 years 11 months ago
Querying RDF Data from a Graph Database Perspective
Abstract. This paper studies the RDF model from a database perspective. From this point of view it is compared with other database models, particularly with graph database models, ...
Renzo Angles, Claudio Gutiérrez
DAWAK
2003
Springer
15 years 11 months ago
Automatic Detection of Structural Changes in Data Warehouses
Data Warehouses provide sophisticated tools for analyzing complex data online, in particular by aggregating data along dimensions spanned by master data. Changes to these master da...
Johann Eder, Christian Koncilia, Dieter Mitsche
DAWAK
2003
Springer
15 years 11 months ago
Clustering by Regression Analysis
Abstract In data clustering, many approaches have been proposed. For example, K-means method and hierarchical method. A problem is in effect by initial value and criterion to comb...
Masahiro Motoyoshi, Takao Miura, Isamu Shioya
ITC
1997
IEEE
60views Hardware» more  ITC 1997»
15 years 10 months ago
Current Signatures: Application
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...
Anne E. Gattiker, Wojciech Maly
ICCAD
1996
IEEE
95views Hardware» more  ICCAD 1996»
15 years 10 months ago
Semi-analytical techniques for substrate characterization in the design of mixed-signal ICs
A number of methods are presentedfor highly efficient calculation of substratecurrenttransport. A three-dimensionalGreen'sFunction based substrate representation, in combinat...
Edoardo Charbon, Ranjit Gharpurey, Alberto L. Sang...