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ICML
2007
IEEE
16 years 3 months ago
Discriminative learning for differing training and test distributions
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
Michael Brückner, Steffen Bickel, Tobias Sche...
VTS
2000
IEEE
97views Hardware» more  VTS 2000»
15 years 7 months ago
A Low-Speed BIST Framework for High-Performance Circuit Testing
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev
121
Voted
SAC
2002
ACM
15 years 2 months ago
An evolutionary algorithm for reducing integrated-circuit test application time
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
EH
2000
IEEE
123views Hardware» more  EH 2000»
15 years 7 months ago
The Test Vector Problem and Limitations to Evolving Digital Circuits
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...
Kosuke Imamura, James A. Foster, Axel W. Krings
ICSM
2006
IEEE
15 years 8 months ago
Model-Based Testing of Community-Driven Open-Source GUI Applications
Although the world-wide-web (WWW) has significantly enhanced open-source software (OSS) development, it has also created new challenges for quality assurance (QA), especially for...
Qing Xie, Atif M. Memon