872 search results - page 42 / 175 » UML-based design test generation |
147
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KBSE
2010
IEEE
15 years 2 months ago
2010
IEEE
Although testing is central to debugging and software certification, there is no adequate language to specify test suites over source code. Such a language should be simple and c...
126
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DDECS
2008
IEEE
15 years 10 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
127
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ITC
1997
IEEE
15 years 8 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
117
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EUROPAR
2004
Springer
15 years 9 months ago
2004
Springer
The APART working group is developing the APART Test Suite (ATS) for evaluating (automatic) performance analysis tools with respect to their correctness – that is, their ability...
196
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ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...