872 search results - page 45 / 175 » UML-based design test generation |
187
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HASE
2002
IEEE
15 years 9 months ago
2002
IEEE
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
149
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ERSA
2010
15 years 2 months ago
2010
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...
159
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VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
118
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ECAL
2001
Springer
15 years 8 months ago
2001
Springer
Bedau and Packard’s evolutionary activity statistics [1, 2] are used to classify the evolutionary dynamics in Geb [3, 4], a system designed to verify and extend theories behind t...
135
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EH
2000
IEEE
15 years 8 months ago
2000
IEEE
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...