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IJOE
2007
107views more  IJOE 2007»
15 years 4 months ago
Learning Digital Test and Diagnostics via Internet
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
Raimund Ubar, Artur Jutman, Margus Kruus, Elmet Or...
DAC
1996
ACM
15 years 8 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
SIGMOD
2010
ACM
215views Database» more  SIGMOD 2010»
15 years 8 months ago
Dynamic symbolic database application testing
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
Chengkai Li, Christoph Csallner
MTDT
2003
IEEE
105views Hardware» more  MTDT 2003»
15 years 9 months ago
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
JAL
1998
85views more  JAL 1998»
15 years 3 months ago
Isomorph-Free Exhaustive Generation
We describe a very general technique for generating families of combinatorial objects without isomorphs. It applies to almost any class of objects for which an inductive construct...
Brendan D. McKay