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Lecture Notes
Comparing systems using measurement, simulation, and queueing models. Common mistakes and how to avoid them, selection of techniques and metrics, art of data presentation, summariz...
114
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ITC
1997
IEEE
15 years 8 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
158
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
155
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ITC
1994
IEEE
15 years 8 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
126
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CVPR
2003
IEEE
16 years 6 months ago
2003
IEEE
In this paper we explore object recognition in clutter. We test our object recognition techniques on Gimpy and EZGimpy, examples of visual CAPTCHAs. A CAPTCHA ("Completely Au...