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ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 9 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
CVPR
2003
IEEE
14 years 9 months ago
Finding and Tracking People from the Bottom Up
We describe a tracker that can track moving people in long sequences without manual initialization. Moving people are modeled with the assumption that, while configuration can var...
Deva Ramanan, David A. Forsyth
CVPR
2008
IEEE
14 years 9 months ago
Image decomposition into structure and texture subcomponents with multifrequency modulation constraints
Texture information in images is coupled with geometric macrostructures and piecewise-smooth intensity variations. Decomposing an image f into a geometric structure component u an...
Georgios Evangelopoulos, Petros Maragos
ICIP
2008
IEEE
14 years 9 months ago
Variational Bayesian image processing on stochastic factor graphs
In this paper, we present a patch-based variational Bayesian framework of image processing using the language of factor graphs (FGs). The variable and factor nodes of FGs represen...
Xin Li
ICDE
2005
IEEE
154views Database» more  ICDE 2005»
14 years 9 months ago
Deep Store: an Archival Storage System Architecture
We present the Deep Store archival storage architecture, a large-scale storage system that stores immutable data efficiently and reliably for long periods of time. Archived data i...
Lawrence You, Kristal T. Pollack, Darrell D. E. Lo...