551 search results - page 10 / 111 » Using Model Checking for Reducing the Cost of Test Generatio... |
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
HASE
2002
IEEE
14 years 15 days ago
2002
IEEE
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
ISSTA
1998
ACM
13 years 11 months ago
1998
ACM
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
HASE
2007
IEEE
13 years 11 months ago
2007
IEEE
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...