551 search results - page 33 / 111 » Using Model Checking for Reducing the Cost of Test Generatio... |
JSS
2007
13 years 7 months ago
2007
This paper describes an approach for generating customized benchmark suites from a software architecture description following a Model Driven Architecture (MDA) approach. The benc...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
DATE
2000
IEEE
14 years 1 days ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
JMLR
2010
13 years 2 months ago
2010
We show how a preselection of hidden variables can be used to efficiently train generative models with binary hidden variables. The approach is based on Expectation Maximization (...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper presents a new technique for on-line consistency checking of embedded DRAMs. The basic idea is to use the periodic refresh operation for concurrently computing a test c...