612 search results - page 11 / 123 » Using Static Analysis to Improve Automatic Test Generation |
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
ACSAC
2004
IEEE
14 years 5 days ago
2004
IEEE
A common way to elude a signature-based NIDS is to transform an attack instance that the NIDS recognizes into another instance that it misses. For example, to avoid matching the a...
SIGSOFT
2003
ACM
14 years 9 months ago
2003
ACM
Real-time, reactive, and embedded systems are increasingly used throughout society (e.g., flight control, railway signaling, vehicle management, medical devices, and many others)....
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...