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» Using Static Analysis to Improve Automatic Test Generation
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ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
14 years 5 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
SBMF
2009
Springer
184views Formal Methods» more  SBMF 2009»
14 years 3 months ago
Concolic Testing of the Multi-sector Read Operation for Flash Memory File System
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...
Moonzoo Kim, Yunho Kim
RV
2010
Springer
122views Hardware» more  RV 2010»
13 years 6 months ago
Clara: A Framework for Partially Evaluating Finite-State Runtime Monitors Ahead of Time
Researchers have developed a number of runtime verification tools that generate runtime monitors in the form of AspectJ aspects. In this work, we present Clara, a novel framework ...
Eric Bodden, Patrick Lam, Laurie J. Hendren
ICSE
2007
IEEE-ACM
14 years 8 months ago
Testing and Analysis of Access Control Policies
Policy testing and analysis are important techniques for high assurance of correct specification of access control policies. We propose a set of testing and analysis techniques fo...
Evan Martin
PLDI
2003
ACM
14 years 1 months ago
Static array storage optimization in MATLAB
An adaptation of the classic register allocation algorithm to the problem of array storage optimization in MATLAB is presented. The method involves the decomposition of an interfe...
Pramod G. Joisha, Prithviraj Banerjee