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VLSID
2008
IEEE
117views VLSI» more  VLSID 2008»
16 years 3 months ago
Single Event Upset: An Embedded Tutorial
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
Fan Wang, Vishwani D. Agrawal
223
Voted
ICDE
2008
IEEE
163views Database» more  ICDE 2008»
16 years 3 months ago
XStream: a Signal-Oriented Data Stream Management System
Sensors capable of sensing phenomena at high data rates on the order of tens to hundreds of thousands of samples per second are now widely deployed in many industrial, civil engine...
Lewis Girod, Yuan Mei, Ryan Newton, Stanislav Rost...
SIGIR
2009
ACM
15 years 9 months ago
Click-through prediction for news queries
A growing trend in commercial search engines is the display of specialized content such as news, products, etc. interleaved with web search results. Ideally, this content should b...
Arnd Christian König, Michael Gamon, Qiang Wu
CODES
2007
IEEE
15 years 9 months ago
Performance improvement of block based NAND flash translation layer
With growing capacities of flash memories, an efficient layer to manage read and write access to flash is required. NFTL is a widely used block based flash translation layer de...
Siddharth Choudhuri, Tony Givargis
ACMDIS
2000
ACM
15 years 7 months ago
From Usability Lab to "Design Collaboratorium": Reframing Usability Practice
This paper presents an exploratory process in which three industrial usability groups, in cooperation with HCI researchers, worked to reframe their own work practice. The usabilit...
Jacob Buur, Susanne Bødker