399 search results - page 4 / 80 » Using genetic algorithms to generate test plans for function... |
VLSID
1997
IEEE
13 years 12 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
CEC
2007
IEEE
14 years 2 months ago
2007
IEEE
— Recent large scale experiments have shown that the Normalized Information Distance, an algorithmic information measure, is among the best similarity metrics for melody classiï¬...
GECCO
2010
Springer
13 years 11 months ago
2010
Springer
Test suite augmentation techniques are used in regression testing to help engineers identify code elements affected by changes, and generate test cases to cover those elements. R...
ICTAI
2002
IEEE
14 years 21 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
GECCO
2003
Springer
14 years 29 days ago
2003
Springer
Supply planning optimization is one of the most important issues for manufacturers and distributors. Supply is planned to meet the future demand. Under the uncertainty involved in ...