Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
Romain Desplats, Felix Beaudoin, Philippe Perdu, N...
Abstract. We propose a new class of distance measures (metrics) designed for multisets, both of which are a recurrent theme in many data mining applications. One particular instanc...
In this paper, we present several ways to measure and evaluate the annotation and annotators, proposed and used during the building of the Czech part of the Prague Czech-English D...
Abstract—Traffic monitoring and estimation of flow parameters in high speed routers have recently become challenging as the Internet grew in both scale and complexity. In this ...
Since clustering is unsupervised and highly explorative, clustering validation (i.e. assessing the quality of clustering solutions) has been an important and long standing researc...