52 search results - page 11 / 11 » Validation of Cryptographic Protocols by Efficient Automated... |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...