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TVLSI
2008
176views more  TVLSI 2008»
15 years 2 months ago
A Fuzzy Optimization Approach for Variation Aware Power Minimization During Gate Sizing
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
TVLSI
2008
126views more  TVLSI 2008»
15 years 2 months ago
Body Bias Voltage Computations for Process and Temperature Compensation
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
JUCS
2007
95views more  JUCS 2007»
15 years 2 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow
BMCBI
2004
123views more  BMCBI 2004»
15 years 2 months ago
galaxieEST: addressing EST identity through automated phylogenetic analysis
Background: Research involving expressed sequence tags (ESTs) is intricately coupled to the existence of large, well-annotated sequence repositories. Comparatively complete and sa...
R. Henrik Nilsson, Balaji Rajashekar, Karl-Henrik ...
BMCBI
2004
97views more  BMCBI 2004»
15 years 2 months ago
Global features of sequences of bacterial chromosomes, plasmids and phages revealed by analysis of oligonucleotide usage pattern
Background: Oligonucleotide frequencies were shown to be conserved signatures for bacterial genomes, however, the underlying constraints have yet not been resolved in detail. In t...
Oleg N. Reva, Burkhard Tümmler