Sciweavers

1585 search results - page 17 / 317
» Variational Analysis of Pseudospectra
Sort
View
ATS
2003
IEEE
126views Hardware» more  ATS 2003»
14 years 24 days ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
EUROGP
2008
Springer
112views Optimization» more  EUROGP 2008»
13 years 9 months ago
Evolvability Via Modularity-Induced Mutational Focussing
Abstract. This work postulates a mechanism by which random genotypic variation is directed towards favourable phenotypic variation. Evolvability is a poorly understood concept at p...
Richard M. Downing
ISCAS
2003
IEEE
131views Hardware» more  ISCAS 2003»
14 years 23 days ago
Process variation dimension reduction based on SVD
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and...
Zhuo Li, Xiang Lu, Weiping Shi
DOCENG
2005
ACM
13 years 9 months ago
Managing syntactic variation in text retrieval
Information Retrieval systems are limited by the linguistic variation of language. The use of Natural Language Processing techniques to manage this problem has been studied for a ...
Jesús Vilares, Carlos Gómez-Rodr&iac...
TVLSI
2008
105views more  TVLSI 2008»
13 years 7 months ago
Fast Estimation of Timing Yield Bounds for Process Variations
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Ruiming Chen, Hai Zhou