In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
Existing feature extraction methods explore either global statistical or local geometric information underlying the data. In this paper, we propose a general framework to learn fea...
Shuang-Hong Yang, Hongyuan Zha, Shaohua Kevin Zhou...
— The analysis regarding the impact of the single-step power control (SSPC) scheme on the system performance such as bit error rate, packet error rate and queueing variation is h...
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
In this paper we present a continuous surface model to describe the interconnect geometric variation, which improves the currently used model for better accuracy while not increas...