- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...
—Variations in walking speed have a strong impact on the recognition of gait. We propose a method of recognition of gait that is robust against walking-speed variations. It is es...
Muhammad Rasyid Aqmar, Koichi Shinoda, Sadaoki Fur...
Variational Bayesian (VB) methods are typically only applied to models in the conjugate-exponential family using the variational Bayesian expectation maximisation (VB EM) algorith...
Antti Honkela, Tapani Raiko, Mikael Kuusela, Matti...
One of the main challenges in image segmentation is to adapt prior knowledge about the objects/regions that are likely to be present in an image, in order to obtain more precise d...
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...