1585 search results - page 74 / 317 » Variational Analysis of Pseudospectra |
DFT
2002
IEEE
14 years 3 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
ITC
1996
IEEE
14 years 2 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
ICSM
2008
IEEE
14 years 4 months ago
2008
IEEE
Distribution of effort in software engineering process has been the basis for facilitating more reasonable software project planning. This paper reports empirical results on activ...
DAGM
2006
Springer
14 years 2 months ago
2006
Springer
Abstract. We present a method for 3D object modeling and recognition which is robust to scale and illumination changes, and to viewpoint variations. The object model is derived fro...
BMCBI
2005
13 years 10 months ago
2005
Background: Interpretation of simple microarray experiments is usually based on the fold-change of gene expression between a reference and a "treated" sample where the t...