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» Variational Analysis of Pseudospectra
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ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
14 years 12 days ago
Handling partial correlations in yield prediction
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Sridhar Varadan, Janet Meiling Wang, Jiang Hu
DATE
2009
IEEE
113views Hardware» more  DATE 2009»
14 years 5 months ago
System-level process variability analysis and mitigation for 3D MPSoCs
Abstract—While prior research has extensively evaluated the performance advantage of moving from a 2D to a 3D design style, the impact of process parameter variations on 3D desig...
Siddharth Garg, Diana Marculescu
WACV
2005
IEEE
14 years 4 months ago
Deformation Analysis for 3D Face Matching
Current two-dimensional image based face recognition systems encounter difficulties with large facial appearance variations due to the pose, illumination and expression changes. ...
Xiaoguang Lu, Anil K. Jain
DOCENG
2007
ACM
14 years 2 months ago
Thresholding of badly illuminated document images through photometric correction
This paper presents a document image thresholding technique that binarizes badly illuminated document images by the photometric correction. Based on the observation that illuminat...
Shijian Lu, Chew Lim Tan
LREC
2008
108views Education» more  LREC 2008»
13 years 11 months ago
Exploiting Lexical Resources for Disambiguating CJK and Arabic Orthographic Variants
The orthographical complexities of Chinese, Japanese, Korean (CJK) and Arabic pose a special challenge to developers of NLP applications. These difficulties are exacerbated by the...
Jack Halpern