In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Abstract—While prior research has extensively evaluated the performance advantage of moving from a 2D to a 3D design style, the impact of process parameter variations on 3D desig...
Current two-dimensional image based face recognition systems encounter difficulties with large facial appearance variations due to the pose, illumination and expression changes. ...
This paper presents a document image thresholding technique that binarizes badly illuminated document images by the photometric correction. Based on the observation that illuminat...
The orthographical complexities of Chinese, Japanese, Korean (CJK) and Arabic pose a special challenge to developers of NLP applications. These difficulties are exacerbated by the...