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ISQED
2000
IEEE
131views Hardware» more  ISQED 2000»
15 years 8 months ago
Low Power Testing of VLSI Circuits: Problems and Solutions
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Patrick Girard
ADAEUROPE
1997
Springer
15 years 8 months ago
Systematic Unit-Testing of Ada Programs
The systematic test is an inevitable part of the verification and validation process for software. Overall support for all testing activities is currently not available in a singl...
Joachim Wegener, Ines Fey
DATE
2003
IEEE
130views Hardware» more  DATE 2003»
15 years 9 months ago
A Technique for High Ratio LZW Compression
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
IJNSEC
2010
98views more  IJNSEC 2010»
14 years 11 months ago
A Random Bit Generator Using Chaotic Maps
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
Narendra K. Pareek, Vinod Patidar, Krishan K. Sud
LOGCOM
2010
154views more  LOGCOM 2010»
14 years 11 months ago
Collaborative Runtime Verification with Tracematches
Perfect pre-deployment test coverage is notoriously difficult to achieve for large applications. Given enough end users, however, many more test cases will be encountered during a...
Eric Bodden, Laurie J. Hendren, Patrick Lam, Ondre...