1093 search results - page 107 / 219 » Verifying VLSI Circuits |
DFT
2007
IEEE
14 years 4 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
We present a complete top-down design of a low-power multi-channel clock recovery circuit based on gated current-controlled oscillators. The flow includes several tools and method...
IPPS
2006
IEEE
14 years 4 months ago
2006
IEEE
Models of simulation program with integrated circuit emphasis (SPICE) are currently playing a central role in the connection between circuit design and chip fabrication communitie...
VLSI
2007
Springer
14 years 4 months ago
2007
Springer
Replacing functional units of an extensible processor with reconfigurable functional units enhances performance and flexibility of processors to execute custom instructions. That ...
DFT
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...