1093 search results - page 124 / 219 » Verifying VLSI Circuits |
VLSI
2010
Springer
13 years 7 months ago
2010
Springer
—Latency insensitivity is a promising design paradigm in the nanometer era since it has potential benefits of increased modularity and robustness to variations. Synchronous elas...
VLSID
2010
IEEE
13 years 7 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
VLSI
2010
Springer
13 years 3 months ago
2010
Springer
Electro-Magnetic Analysis has been identified as an efficient technique to retrieve the secret key of cryptographic algorithms. Although similar mathematically speaking, Power or E...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...