1093 search results - page 152 / 219 » Verifying VLSI Circuits |
ATS
2010
IEEE
13 years 6 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
FCCM
2005
IEEE
14 years 2 months ago
2005
IEEE
Just-in-time (JIT) compilation has been used in many applications to enable standard software binaries to execute on different underlying processor architectures. We previously in...
ISPD
2005
ACM
14 years 2 months ago
2005
ACM
As thermal problems become more evident, new physical design paradigms and tools are needed to alleviate them. Incorporating thermal vias into integrated circuits (ICs) is a promi...
SBCCI
2009
ACM
14 years 1 months ago
2009
ACM
Because of the aggressive scaling of integrated circuits and the given limits of atomic scales, circuit designers have to become more and more aware of the arising reliability and...