86 search results - page 13 / 18 » WISE: Automated test generation for worst-case complexity |
ITC
2002
IEEE
14 years 16 days ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
EDBT
2010
ACM
14 years 22 days ago
2010
ACM
Database engines and database-centric applications have become complex software systems. Ensuring bug-free database services is therefore a very difficult task. Whenever possible...
ATS
1997
IEEE
13 years 12 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
AEI
1999
13 years 7 months ago
1999
Design synthesis represents a highly complex task in the field of industrial design. The main difficulty in automating it is the definition of the design and performance spaces, i...
ICLP
2009
Springer
14 years 8 months ago
2009
Springer
Abstract. A class of probabilistic-logic models is considered, which increases the expressibility from HMM's and SCFG's regular and contextfree languages to, in principle...