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» WISE: Automated test generation for worst-case complexity
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SIGSOFT
2007
ACM
14 years 8 months ago
Improving test case generation for web applications using automated interface discovery
With the growing complexity of web applications, identifying web interfaces that can be used for testing such applications has become increasingly challenging. Many techniques tha...
William G. J. Halfond, Alessandro Orso
KBSE
2010
IEEE
13 years 6 months ago
MODA: automated test generation for database applications via mock objects
Software testing has been commonly used in assuring the quality of database applications. It is often prohibitively expensive to manually write quality tests for complex database ...
Kunal Taneja, Yi Zhang, Tao Xie
ICST
2009
IEEE
14 years 2 months ago
PKorat: Parallel Generation of Structurally Complex Test Inputs
Constraint solving lies at the heart of several specification-based approaches to automated testing. Korat is a previously developed algorithm for solving constraints in Java pro...
Junaid Haroon Siddiqui, Sarfraz Khurshid
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
14 years 2 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
DAC
2005
ACM
14 years 8 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin