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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
14 years 2 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
KDD
1998
ACM
190views Data Mining» more  KDD 1998»
14 years 2 months ago
Time Series Forecasting from High-Dimensional Data with Multiple Adaptive Layers
This paper describes our work in learning online models that forecast real-valued variables in a high-dimensional space. A 3GB database was collected by sampling 421 real-valued s...
R. Bharat Rao, Scott Rickard, Frans Coetzee
HPDC
1997
IEEE
14 years 2 months ago
A Secure Communications Infrastructure for High-Performance Distributed Computing
We describe a software infrastructure designed to support the development of applications that use high-speed networks to connect geographically distributed supercomputers, databa...
Ian T. Foster, Nicholas T. Karonis, Carl Kesselman...
VLDB
1997
ACM
97views Database» more  VLDB 1997»
14 years 2 months ago
The Complexity of Transformation-Based Join Enumeration
Query optimizers that explore a search space exhaustively using transformation rules usually apply all possible rules on each alternative, and stop when no new information is prod...
Arjan Pellenkoft, César A. Galindo-Legaria,...
AMOST
2007
ACM
14 years 2 months ago
Achieving both model and code coverage with automated gray-box testing
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Till...
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