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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 11 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
IMC
2010
ACM
13 years 5 months ago
What happened in my network: mining network events from router syslogs
Router syslogs are messages that a router logs to describe a wide range of events observed by it. They are considered one of the most valuable data sources for monitoring network ...
Tongqing Qiu, Zihui Ge, Dan Pei, Jia Wang, Jun Xu
CGI
1998
IEEE
13 years 11 months ago
Fast Approximate Quantitative Visibility for Complex Scenes
Ray tracing and Monte-Carlo based global illumination, as well as radiosity and other finite-element based global illumination methods, all require repeated evaluation of quantita...
Yiorgos Chrysanthou, Daniel Cohen-Or, Dani Lischin...
ADMA
2006
Springer
127views Data Mining» more  ADMA 2006»
14 years 1 months ago
Feature Selection for Complex Patterns
Feature selection is an important data preprocessing step in data mining and pattern recognition. Many algorithms have been proposed in the past for simple patterns that can be cha...
Peter Schenkel, Wanqing Li, Wanquan Liu
CORR
2012
Springer
170views Education» more  CORR 2012»
12 years 3 months ago
What Cannot be Learned with Bethe Approximations
We address the problem of learning the parameters in graphical models when inference is intractable. A common strategy in this case is to replace the partition function with its B...
Uri Heinemann, Amir Globerson