91 search results - page 4 / 19 » What We Have Learned About Fighting Defects |
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
WIFT
1998
IEEE
13 years 11 months ago
1998
IEEE
In this paper I examine what industry really needs from formal specification techniques. I first describe the background to our use of formal techniques. I then look at the role o...
ITS
2010
Springer
14 years 7 days ago
2010
Springer
The traditional, well established approach to finding out what works in education research is to run a randomized controlled trial (RCT) using a standard pretest and posttest desig...
CHI
2005
ACM
14 years 7 months ago
2005
ACM
From pre-schools to high schools, at home and in museums, the educational community has embraced the use of computers as a teaching tool. Yet many institutions will simply install...
ICML
2010
IEEE
13 years 8 months ago
2010
IEEE
Transfer learning can be described as the tion of abstract knowledge from one learning domain or task and the reuse of that knowledge in a related domain or task. In categorizatio...