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ICCAD
2010
IEEE
146views Hardware» more  ICCAD 2010»
13 years 8 months ago
Through-silicon-via management during 3D physical design: When to add and how many?
In 3D integrated circuits through silicon vias (TSVs) are used to connect different dies stacked on top of each other. These TSV occupy silicon area and have significantly larger a...
Mohit Pathak, Young-Joon Lee, Thomas Moon, Sung Ky...
COLING
2010
13 years 4 months ago
Best Topic Word Selection for Topic Labelling
This paper presents the novel task of best topic word selection, that is the selection of the topic word that is the best label for a given topic, as a means of enhancing the inte...
Jey Han Lau, David Newman, Sarvnaz Karimi, Timothy...
FOCS
2000
IEEE
14 years 2 months ago
Linear Waste of Best Fit Bin Packing on Skewed Distributions
We prove that Best Fit bin packing has linear waste on the discrete distribution Ufj kg (where items are drawn uniformly from the set f1=k 2=3 j=kg) for sufficiently large k when...
Claire Kenyon, Michael Mitzenmacher
DAM
2006
89views more  DAM 2006»
13 years 10 months ago
First vs. best improvement: An empirical study
When applying the 2-opt heuristic to the travelling salesman problem, selecting the best improvement at each iteration gives worse results on average than selecting the first impr...
Pierre Hansen, Nenad Mladenovic
SEMWEB
2009
Springer
14 years 4 months ago
BestMap: Context-Aware SKOS Vocabulary Mappings in OWL 2
Abstract. This paper describes an approach to SKOS vocabulary mapping that takes into account the context in which vocabulary terms are used in annotations. The standard vocabulary...
Rinke Hoekstra