237 search results - page 35 / 48 » Which concurrent error detection scheme to choose |
KBSE
2009
IEEE
14 years 2 months ago
2009
IEEE
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
ICVS
2009
Springer
13 years 5 months ago
2009
Springer
This paper introduces a system that automatically classifies registration problems based on the type of registration required. Rather than rely on a single "best" algorit...
NFM
2011
13 years 2 months ago
2011
Abstract. Data race is one of the most dangerous errors in multithreaded programming, and despite intensive studies, it remains a notorious cause of failures in concurrent systems....
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
Transactional Memory (TM) systems must track the read and write sets—items read and written during a transaction—to detect conflicts among concurrent transactions. Several TM...
DPHOTO
2009
13 years 5 months ago
2009
The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...