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ASPDAC
2006
ACM
104views Hardware» more  ASPDAC 2006»
15 years 12 months ago
A multi-technology-process reticle floorplanner and wafer dicing planner for multi-project wafers
—As the VLSI manufacturing technology advances into the deep sub-micron(DSM) era, the mask cost can reach one or two million dollars. Multiple project wafers (MPW) which put diï¬...
Chien-Chang Chen, Wai-Kei Mak
WACV
2005
IEEE
15 years 11 months ago
Isomap and Nonparametric Models of Image Deformation
Isomap is an exemplar of a set of data driven nonlinear dimensionality reduction techniques that have shown promise for the analysis of images and video. These methods parameteriz...
Richard Souvenir, Robert Pless
HICSS
2003
IEEE
129views Biometrics» more  HICSS 2003»
15 years 11 months ago
Towards an Ontology for e-Document Management in Public Administration - the Case of Schleswig-Holstein
An action research project in the state administration of Schleswig-Holstein (Germany) seeks to answer the following questions: How can we organize and present edocuments so that ...
Ralf Klischewski
DAC
2003
ACM
15 years 11 months ago
NORM: compact model order reduction of weakly nonlinear systems
This paper presents a compact Nonlinear model Order Reduction Method (NORM) that is applicable for time-invariant and time-varying weakly nonlinear systems. NORM is suitable for r...
Peng Li, Lawrence T. Pileggi
FGR
2000
IEEE
181views Biometrics» more  FGR 2000»
15 years 10 months ago
Face Detection Using Mixtures of Linear Subspaces
We present two methods using mixtures of linear subspaces for face detection in gray level images. One method uses a mixture of factor analyzers to concurrently perform clustering...
Ming-Hsuan Yang, Narendra Ahuja, David J. Kriegman