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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 4 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
CCGRID
2005
IEEE
14 years 3 months ago
Experiences in teaching grid computing to advanced level students
The development of teaching materials for future software engineers is critical to the long term success of the Grid. At present however there is considerable turmoil in the Grid ...
Richard O. Sinnott, A. J. Stell, J. P. Watt
ISORC
2005
IEEE
14 years 3 months ago
Placement Solutions for Multiple Versions of A Multimedia Object
Transcoding is an important technology which adapts the same multimedia object to diverse mobile appliances; thus, users’ requests for a specified version of a multimedia objec...
Keqiu Li, Hong Shen, Francis Y. L. Chin
TRIDENTCOM
2005
IEEE
14 years 3 months ago
A Testbed for Evaluating Human Interaction with Ubiquitous Computing Environments
Core to ubiquitous computing environments are adaptive software systems that adapt their behavior to the context in which the user is attempting the task the system aims to suppor...
Eleanor O'Neill, Martin Klepal, David Lewis, Tony ...
SAC
2005
ACM
14 years 3 months ago
Pollock: automatic generation of virtual web services from web sites
As the usage of Web Services proliferates dramatically, new tools to help quickly generate web services are needed. In this paper, we propose a methodology that helps to automatic...
Yi-Hsuan Lu, Yoojin Hong, Jinesh Varia, Dongwon Le...