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ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
TSD
1999
Springer
13 years 12 months ago
1999
Springer
The use of the treebank as a resource for linguistic research has led us to look for an annotation scheme representing not only surface syntactic information (in ‘analytic treesâ...
NAR
1998
13 years 7 months ago
1998
The eighth edition of the haemophilia B database (http://www.umds.ac.uk/molgen/haemBdatabase.htm ) lists in an easily accessible form all known factor IX mutations due to small ch...