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94
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ATS
2000
IEEE
87views Hardware» more  ATS 2000»
15 years 8 months ago
Functional Testing of Microprocessors with Graded Fault Coverage
Rajesh Kannah, C. P. Ravikumar
76
Voted
ATS
2000
IEEE
59views Hardware» more  ATS 2000»
15 years 8 months ago
Testing in the Fourth Dimension
Vishwani D. Agrawal, Kwang-Ting Cheng
ATS
2000
IEEE
57views Hardware» more  ATS 2000»
15 years 8 months ago
Fast hierarchical test path construction for DFT-free controller-datapath circuits
Yiorgos Makris, Jamison Collins, Alex Orailoglu
112
Voted
ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 8 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
92
Voted
ATS
2000
IEEE
101views Hardware» more  ATS 2000»
15 years 8 months ago
A new framework for static timing analysis, incremental timing refinement, and timing simulation
Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer